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Low frequency fluctuation study using a microwave interferometer and Hα line emission measurement systems in the Pilot-PSI device
http://hdl.handle.net/2241/00160210
http://hdl.handle.net/2241/00160210bdb94b82-1147-44a8-b476-065def525b38
名前 / ファイル | ライセンス | アクション |
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AIPAdv_9-085225.pdf (4.6 MB)
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Item type | Journal Article(1) | |||||||||||
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公開日 | 2020-06-25 | |||||||||||
タイトル | ||||||||||||
言語 | en | |||||||||||
タイトル | Low frequency fluctuation study using a microwave interferometer and Hα line emission measurement systems in the Pilot-PSI device | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
資源タイプ | ||||||||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||||||||
タイプ | journal article | |||||||||||
アクセス権 | ||||||||||||
アクセス権 | open access | |||||||||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||||||||
著者 |
吉川, 正志
× 吉川, 正志× 小波藏, 純子
WEKO
157129
× 坂本, 瑞樹× Meiden, H. v. d.× AL, R.× Vernimmen, J.× Shima, Y.× Nakashima, Y. |
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書誌情報 |
en : AIP Advances 巻 9, 号 8, p. 085225, 発行日 2019-08 |
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ISSN | ||||||||||||
収録物識別子タイプ | EISSN | |||||||||||
収録物識別子 | 2158-3226 | |||||||||||
DOI | ||||||||||||
関連タイプ | isIdenticalTo | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | https://doi.org/10.1063/1.5099648 | |||||||||||
権利 | ||||||||||||
言語 | en | |||||||||||
権利情報 | © 2019 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). https://doi.org/10.1063/1.5099648 | |||||||||||
出版タイプ | ||||||||||||
出版タイプ | VoR | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||
出版者 | ||||||||||||
言語 | en | |||||||||||
出版者 | American Institute of Physics |