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  1. 数理物質系 (Faculty of Pure and Applied Sciences)
  2. 丸本 一弘 (Marumoto Kazuhiro)
  1. コンテンツタイプ (Contents Type)
  2. 雑誌発表論文等 (Journal article, etc.)
  3. A~
  4. Applied physics letters

Dramatic enhancement of fullerene anion formation in polymer solar cells by thermal annealing: Direct observation by electron spin resonance

http://hdl.handle.net/2241/00121951
2d9b96ac-4c13-47a1-881f-ad9e1677e864
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APL_104-24.pdf APL_104-24 (1.5 MB)
item type Journal Article(1)
公開日 2014-08-18
タイトル
タイトル Dramatic enhancement of fullerene anion formation in polymer solar cells by thermal annealing: Direct observation by electron spin resonance
言語
言語 eng
資源タイプ
タイプ journal article
著者 Liu, Dong

× Liu, Dong

WEKO 107642

Liu, Dong

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Nagamori, Tatsuya

× Nagamori, Tatsuya

WEKO 107643

Nagamori, Tatsuya

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Yabusaki, Masaki

× Yabusaki, Masaki

WEKO 107644

Yabusaki, Masaki

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Yasuda, Takeshi

× Yasuda, Takeshi

WEKO 107645

Yasuda, Takeshi

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Han, Liyuan

× Han, Liyuan

WEKO 107646

Han, Liyuan

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Marumoto, Kazuhiro

× Marumoto, Kazuhiro

WEKO 107647

Marumoto, Kazuhiro

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著者別名 丸本, 一弘

× 丸本, 一弘

WEKO 107648

丸本, 一弘

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抄録
内容記述 Using electron spin resonance (ESR), we clarified the origin of the efficiency degradation of polymer solar cells containing a lithium-fluoride (LiF) buffer layer created by a thermal annealing process after the deposition of an Al electrode (post-annealing). The device structure was indium-tin-oxide/ poly(3,4-ethylenedioxythiophene):poly(4-styrenesulfonate)/poly(3-hexylthiophene):phenyl-C61-butyric acid methyl ester (P3HT:PCBM)/LiF/Al. Three samples consisting of quartz/P3HT:PCBM/LiF/Al, quartz/P3HT:PCBM/Al, and quartz/PCBM/LiF/Al were investigated and compared. A clear ESR signal from radical anions on the PCBM was observed after LiF/Al was deposited onto a P3HT:PCBM layer because of charge transfer at the interface between the PCBM and the LiF/Al, which indicated the formation of PCBM−Li+ complexes. The number of radical anions on the PCBM was enhanced remarkably by the post-annealing process; this enhancement was caused by the surface segregation of PCBM and by the dissociation of LiF at the Al interface by the post-annealing process. The formation of a greater number of anions enhanced the electron scattering, decreased the electron-transport properties of the PCBM molecules, and caused an energy-level shift at the interface. These effects led to degradation in the device performance.
書誌情報 Applied physics letters

巻 104, 号 24, p. 243903, 発行日 2014-06
ISSN
収録物識別子 0003-6951
書誌レコードID
収録物識別子 AA00543431
DOI
関連識別子
関連識別子 10.1063/1.4883858
権利
権利情報 © 2014 AIP Publishing LLC. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 104, 243903 (2014) and maybe found at http://dx.doi.org/10.1063/1.4883858
著者版フラグ
値 publisher
出版者
出版者 American Institute of Physics
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