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Scaling near random criticality in two-dimensional Dirac fermions
http://hdl.handle.net/2241/100842
2edf5861-5d2f-403a-a181-36e2c2d2d3fe
名前 / ファイル | ライセンス | Actions | |
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item type | Journal Article(1) | |||||
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公開日 | 2008-10-31 | |||||
タイトル | ||||||
タイトル | Scaling near random criticality in two-dimensional Dirac fermions | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
タイプ | journal article | |||||
著者 |
Morita, Y.
× Morita, Y.× Hatsugai, Y. |
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著者別名 |
初貝, 安弘
× 初貝, 安弘 |
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抄録 | ||||||
内容記述 | Recently the existence of a random critical line in two-dimensional Dirac fermions was confirmed. In this paper, we focus on its scaling properties, especially in the critical region. We treat Dirac fermions in two dimensions with two types of randomness, a random site (RS) model and a random hopping (RH) model. The RS model belongs to the usual orthogonal class and all states are localized. For the RH model, there is an additional symmetry expressed by {H,γ}=0. Therefore, although all nonzero energy states localize, the localization length diverges at the zero energy. In the weak localization region, the generalized Ohm’s law in fractional dimensions, d*(<2), has been observed for the RH model. | |||||
書誌情報 |
Physical review B 巻 58, 号 11, p. 6680-6683, 発行日 1998-09 |
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ISSN | ||||||
収録物識別子 | 1098-0121 | |||||
書誌レコードID | ||||||
収録物識別子 | AA11187113 | |||||
DOI | ||||||
関連識別子 | ||||||
関連識別子 | 10.1103/PhysRevB.58.6680 | |||||
権利 | ||||||
権利情報 | © 1998 The American Physical Society | |||||
著者版フラグ | ||||||
値 | publisher | |||||
出版者 | ||||||
出版者 | The American Physical Society |