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  1. 数理物質系 (Faculty of Pure and Applied Sciences)
  2. 初貝 安弘 (Hatsugai Yasuhiro)
  1. コンテンツタイプ (Contents Type)
  2. 雑誌発表論文等 (Journal article, etc.)
  3. P~
  4. Physical review B

Scaling near random criticality in two-dimensional Dirac fermions

http://hdl.handle.net/2241/100842
2edf5861-5d2f-403a-a181-36e2c2d2d3fe
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PRB_58-11.pdf PRB_58-11.pdf (112.6 kB)
item type Journal Article(1)
公開日 2008-10-31
タイトル
タイトル Scaling near random criticality in two-dimensional Dirac fermions
言語
言語 eng
資源タイプ
タイプ journal article
著者 Morita, Y.

× Morita, Y.

WEKO 60207

Morita, Y.

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Hatsugai, Y.

× Hatsugai, Y.

WEKO 60208

Hatsugai, Y.

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著者別名 初貝, 安弘

× 初貝, 安弘

WEKO 110
e-Rad 80218495
筑波大学研究者総覧 0000000537

初貝, 安弘

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抄録
内容記述 Recently the existence of a random critical line in two-dimensional Dirac fermions was confirmed. In this paper, we focus on its scaling properties, especially in the critical region. We treat Dirac fermions in two dimensions with two types of randomness, a random site (RS) model and a random hopping (RH) model. The RS model belongs to the usual orthogonal class and all states are localized. For the RH model, there is an additional symmetry expressed by {H,γ}=0. Therefore, although all nonzero energy states localize, the localization length diverges at the zero energy. In the weak localization region, the generalized Ohm’s law in fractional dimensions, d*(<2), has been observed for the RH model.
書誌情報 Physical review B

巻 58, 号 11, p. 6680-6683, 発行日 1998-09
ISSN
収録物識別子 1098-0121
書誌レコードID
収録物識別子 AA11187113
DOI
関連識別子
関連識別子 10.1103/PhysRevB.58.6680
権利
権利情報 © 1998 The American Physical Society
著者版フラグ
値 publisher
出版者
出版者 The American Physical Society
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