{"created":"2021-03-01T06:44:07.884833+00:00","id":8679,"links":{},"metadata":{"_buckets":{"deposit":"e715a456-f5d2-4ea7-9667-6a38432ab0d7"},"_deposit":{"id":"8679","owners":[],"pid":{"revision_id":0,"type":"depid","value":"8679"},"status":"published"},"_oai":{"id":"oai:tsukuba.repo.nii.ac.jp:00008679","sets":["3:233:244"]},"author_link":["35622"],"item_12_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004","bibliographicIssueDateType":"Issued"}}]},"item_12_date_granted_46":{"attribute_name":"学位授与年月日","attribute_value_mlt":[{"subitem_dategranted":"2004-03-25"}]},"item_12_degree_grantor_44":{"attribute_name":"学位授与大学","attribute_value_mlt":[{"subitem_degreegrantor":[{"subitem_degreegrantor_language":"ja","subitem_degreegrantor_name":"筑波大学"},{"subitem_degreegrantor_language":"en","subitem_degreegrantor_name":"University of Tsukuba"}],"subitem_degreegrantor_identifier":[{"subitem_degreegrantor_identifier_name":"12102","subitem_degreegrantor_identifier_scheme":"kakenhi"}]}]},"item_12_degree_name_43":{"attribute_name":"取得学位","attribute_value_mlt":[{"subitem_degreename":"博士（工学） "},{"subitem_degreename":"Doctor of Philosophy in Engineering"}]},"item_12_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本研究は、固体表面の重要で基礎的な物性量である仕事関数の詳細な理解とその制御を目指したものである。走査トンネル顕微鏡(Scanning Tunneling Microscopy;STM)及び超音速分子線散乱技術の特に表面敏感でありかつ相補的な二つの計測手法による表面単原子層計測を通じて、仕事関数の微視的性質を解明し、仕事関数の理解を深めることを目的とした。STMでは、探針試料間のバリアハイト計測による微視的仕事関数の研究を行った。基礎段階ではバリアハイトの計測及び評価手法の確立を目指した計測、応用段階ではバリアハイト計測による表面内の微視的仕事関数分布の評価を行った。基礎段階では、金属表面のバリアハイトの定量的計測を通して、バリアハイト計測により微視的仕事関数の相対値の定量評価が可能であることを示した。また、金属及び半導体再構成表面のバリアハイト計測により、バリアハイトと微視的表面構造との関係を明らかにした。応用段階では、面内で不均一な層間相互作用を示す単原子吸着層のバリアハイト計測により、基板吸着層間結合の分布に対応した微視的仕事関数分布の存在を明らかにした。さらに、アルカリ元素吸着表面のバリアハイト計測からは、アルカリ元素吸着による、表面全域での微視的仕事関数変調を直接的に明らかにした。 ･･･","subitem_description_language":"ja","subitem_description_type":"Abstract"}]},"item_12_description_45":{"attribute_name":"学位授与年度","attribute_value_mlt":[{"subitem_description":"2003","subitem_description_type":"Other"}]},"item_12_dissertation_number_47":{"attribute_name":"報告番号","attribute_value_mlt":[{"subitem_dissertationnumber":"甲第3402号"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山田, 洋一","creatorNameLang":"ja"},{"creatorName":"Yamada, Yoichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"35622","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2013-12-18"}],"displaytype":"detail","filename":"A3402.pdf","filesize":[{"value":"125.8 kB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"abstract","url":"https://tsukuba.repo.nii.ac.jp/record/8679/files/A3402.pdf"},"version_id":"bb383d26-19ee-4072-925a-2c4dab7c289f"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2013-12-18"}],"displaytype":"detail","filename":"1.pdf","filesize":[{"value":"25.8 MB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tsukuba.repo.nii.ac.jp/record/8679/files/1.pdf"},"version_id":"064567c6-6dc7-4764-8411-444d6f293795"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"doctoral thesis","resourceuri":"http://purl.org/coar/resource_type/c_db06"}]},"item_title":"走査トンネル顕微鏡及び超音速分子線散乱法による表面単原子層の研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"走査トンネル顕微鏡及び超音速分子線散乱法による表面単原子層の研究","subitem_title_language":"ja"}]},"item_type_id":"12","owner":"1","path":["244"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-07-25"},"publish_date":"2007-07-25","publish_status":"0","recid":"8679","relation_version_is_last":true,"title":["走査トンネル顕微鏡及び超音速分子線散乱法による表面単原子層の研究"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-01T01:48:15.095066+00:00"}