@article{oai:tsukuba.repo.nii.ac.jp:00007570,
 author = {梅田, 享英 and UMEDA, Takahide and Okonogi, K. and Ohyu, K. and Tsukada, S. and Hamada, K. and Fujieda, S. and Mochizuki, Y.},
 journal = {Applied Physics Letters},
 month = {Jun},
 title = {Single silicon vacancy-oxygen complex defect and variable retention time phenomenon in dynamic random access memories},
 volume = {88},
 year = {2006},
 yomi = {ウメダ, タカヒデ}
}