@article{oai:tsukuba.repo.nii.ac.jp:00056199,
 author = {矢野, 裕司 and YANO, Hiroshi and 梅田, 享英 and UMEDA, Takahide and Higa, E. and Sometani, M. and Hirai, H. and Harada, S.},
 issue = {17},
 journal = {Applied Physics Letters},
 month = {Apr},
 title = {Electrically detected magnetic resonance study on interface defects at nitrided Si-face, a-face, and m-face 4H-SiC/SiO2 interfaces},
 volume = {116},
 year = {2020},
 yomi = {ヤノ, ヒロシ and ウメダ, タカヒデ}
}