@article{oai:tsukuba.repo.nii.ac.jp:00054834,
 author = {梅田, 享英 and UMEDA, Takahide and Kagoyama, Y. and Tomita, K. and Abe, Y. and Sometani, M. and Okamoto, M. and Harada, S. and Hatakeyama, T.},
 issue = {15},
 journal = {Applied Physics Letters},
 month = {Oct},
 title = {Electrically detected-magnetic-resonance identifications of defects at 4H-SiC(000    1 ¯)/SiO2 interfaces with wet oxidation},
 volume = {115},
 year = {2019},
 yomi = {ウメダ, タカヒデ}
}