{"created":"2021-03-01T07:35:23.282458+00:00","id":54550,"links":{},"metadata":{"_buckets":{"deposit":"aceb6d13-4cff-4415-943b-859f356e8b21"},"_deposit":{"created_by":188,"id":"54550","owners":[188],"pid":{"revision_id":0,"type":"depid","value":"54550"},"status":"published"},"_oai":{"id":"oai:tsukuba.repo.nii.ac.jp:00054550","sets":["117:2585","117:7929","3:62:5587:7928"]},"author_link":["204667","218807","218808","218809","102882"],"item_1644910766877":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-07","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"60","bibliographicPageStart":"56","bibliographicVolumeNumber":"17","bibliographic_titles":[{"bibliographic_title":"e-Journal of Surface Science and Nanotechnology","bibliographic_titleLang":"en"}]}]},"item_5_publisher_27":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Vacuum and Surface Science","subitem_publisher_language":"en"}]},"item_5_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1380/ejssnt.2019.56","subitem_relation_type_select":"DOI"}}]},"item_5_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"All articles published on e-J. Surf. Sci. Nanotechnol. are licensed under the Creative Commons Attribution 4.0 International (CC BY 4.0). You are free to copy and redistribute articles in any medium or format and also free to remix, transform, and build upon articles for any purpose (including a commercial use) as long as you give appropriate credit to the original source and provide a link to the Creative Commons (CC) license. If you modify the material, you must indicate changes in a proper way.","subitem_rights_language":"en"}]},"item_5_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1348-0391","subitem_source_identifier_type":"EISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"蓮沼, 隆","creatorNameLang":"ja"},{"creatorName":"ハスヌマ, リュウ","creatorNameLang":"ja-Kana"},{"creatorName":"HASUNUMA, Ryu","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Yamashita, Yoshiyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nagata, Takahiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Chikyow, Toyohiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamabe, Kikuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-04-20"}],"displaytype":"detail","filename":"eJSSNT_17.pdf","filesize":[{"value":"828.7 kB"}],"format":"application/pdf","licensetype":"license_0","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tsukuba.repo.nii.ac.jp/record/54550/files/eJSSNT_17.pdf"},"version_id":"fe2bfad3-c3cd-4119-8c2e-f1323c84e56c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Spectroscopic Observation of the Interface States at the SiO<sub>2</sub>/4H-SiC(0001) Interface","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Spectroscopic Observation of the Interface States at the SiO<sub>2</sub>/4H-SiC(0001) Interface","subitem_title_language":"en"}]},"item_type_id":"5","owner":"188","path":["7929","2585","7928"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-04-20"},"publish_date":"2020-04-20","publish_status":"0","recid":"54550","relation_version_is_last":true,"title":["Spectroscopic Observation of the Interface States at the SiO<sub>2</sub>/4H-SiC(0001) Interface"],"weko_creator_id":"188","weko_shared_id":-1},"updated":"2023-08-04T02:14:51.498375+00:00"}