@article{oai:tsukuba.repo.nii.ac.jp:00049339,
 author = {大川, 英希 and OKAWA, Hideki and Benoit, M. and Braccini, S. and Casanova, R. and Cavallaro, E. and Chen, H. and Chen, K. and Bello, F.A. Di and Ferrere, D. and Frizzell, D. and Golling, T. and Gonzalez-Sevilla, S. and Grinstein, S. and Iacobucci, G. and Kiehn, M. and Lanni, F. and Liu, H. and Metcalfe, J. and Meng, L. and Merlassino, C. and Miucci, A. and Muenstermann, D. and Nessi, M. and Peri?, I. and Rimoldi, M. and Risti?, B. and Sultan, D.M.S. and Terzo, S. and Pinto, M. Vicente Barrero and Figueras, E. Vilella and Weber, M. and Weston, T. and Wu, W. and Xie, J. and Xu, L. and Zaffaroni, E. and Zhang, M.},
 issue = {12},
 journal = {Journal of instrumentation},
 month = {Dec},
 title = {Test beam measurement of ams H35 HV-CMOS capacitively coupled pixel sensor prototypes with high-resistivity substrate},
 volume = {13},
 year = {2018},
 yomi = {オオカワ, ヒデキ}
}