@article{oai:tsukuba.repo.nii.ac.jp:00048514,
 author = {Fujita, Eigo and Sometani, Mitsuru and Hatakeyama, Tetsuo and Harada, Shinsuke and 矢野, 裕司 and YANO, Hiroshi and Hosoi, Takuji and Shimura, Takayoshi and Watanabe, Heiji},
 issue = {8},
 journal = {AIP Advances},
 month = {Aug},
 title = {Insight into enhanced field-effect mobility of 4H-SiC MOSFET with Ba incorporation studied by Hall effect measurements},
 volume = {8},
 year = {2018},
 yomi = {ヤノ, ヒロシ}
}