@misc{oai:tsukuba.repo.nii.ac.jp:00048302,
 author = {Xufang, Zhang and 張, 旭芳},
 month = {},
 note = {2018},
 title = {Modeling and Characterization of Near-Interface Traps in SiC Metal-Oxide-Semiconductor Devices},
 year = {2018}
}