@article{oai:tsukuba.repo.nii.ac.jp:00047767,
 author = {Namai, Masaki and An, Junjie and Yano, Hiroshi and 岩室, 憲幸 and IWAMURO, Noriyuki},
 issue = {7},
 journal = {Japanese Journal of Applied Physics},
 month = {Jun},
 title = {Investigation of short-circuit failure mechanisms of SiC MOSFETs by varying DC bus voltage},
 volume = {57},
 year = {2018},
 yomi = {イワムロ, ノリユキ}
}