{"created":"2021-03-01T07:26:29.884498+00:00","id":46573,"links":{},"metadata":{"_buckets":{"deposit":"93c0ab7d-f572-4acf-9af7-892c6f710c63"},"_deposit":{"id":"46573","owners":[],"pid":{"revision_id":0,"type":"depid","value":"46573"},"status":"published"},"_oai":{"id":"oai:tsukuba.repo.nii.ac.jp:00046573","sets":["117:1216","3:62:5592:6693"]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageEnd":"405","bibliographicPageStart":"397","bibliographicVolumeNumber":"60","bibliographic_titles":[{"bibliographic_title":"Journal of the Vacuum Society of Japan (真空)"}]}]},"item_5_creator_3":{"attribute_name":"著者別名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"FUJITA, Jun-ichi"}],"nameIdentifiers":[{}]}]},"item_5_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"High-sensitive visualization of the local electric and magnetic field is possible using a low energy electron beam combining with a simple grid detector configuration. The beam deflection goes along with the clear principle that the larger deflection can be induced by lower energy electron based on the Rutherford scattering scheme. The field distribution around two-dimensional materials allows quantitative analysis of the local field, showing good agreements with FEM simulation. Well defined beam scanning control established in the recent scanning electron microscope (SEM) can project the detector grid image superimposed on the specimen image. And thus the localized field distribution was easily visualized through a simple E-filed vector translation based on the deflection configuration. Detailed techniques and the analysis were described from the viewpoint of practical applications.","subitem_description_type":"Abstract"}]},"item_5_publisher_27":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"公益社団法人日本表面真空学会"}]},"item_5_publisher_28":{"attribute_name":"出版者別名","attribute_value_mlt":[{"subitem_publisher":"The Vacuum Society of Japan"}]},"item_5_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.3131/jvsj2.60.397","subitem_relation_type_select":"DOI"}}]},"item_5_relation_39":{"attribute_name":"異版である","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/article/jvsj2/60/10/60_17-RV-022/_article","subitem_relation_type_select":"URI"}}]},"item_5_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2017 The Vacuum Society of Japan"}]},"item_5_select_15":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_select_item":"author"}]},"item_5_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-2398","subitem_source_identifier_type":"ISSN"}]},"item_5_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00119871","subitem_source_identifier_type":"NCID"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"藤田, 淳一"},{"creatorName":"フジタ, ジュンイチ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-06-04"}],"displaytype":"detail","filename":"JVSJ_60-10.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"JVSJ_60-10","url":"https://tsukuba.repo.nii.ac.jp/record/46573/files/JVSJ_60-10.pdf"},"version_id":"4b70aea3-81f5-44bd-8d60-e0639497ff0e"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"低加速電子線 SEM / STEM を用いた局在場可視化技術","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"低加速電子線 SEM / STEM を用いた局在場可視化技術"},{"subitem_title":"Visualization of Localized Field Using Deflection of Low-Energy Electron Beam with SEM/STEM","subitem_title_language":"en"}]},"item_type_id":"5","owner":"1","path":["1216","6693"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-06-04"},"publish_date":"2018-06-04","publish_status":"0","recid":"46573","relation_version_is_last":true,"title":["低加速電子線 SEM / STEM を用いた局在場可視化技術"],"weko_creator_id":"1","weko_shared_id":5},"updated":"2022-04-27T09:18:29.374265+00:00"}