@article{oai:tsukuba.repo.nii.ac.jp:00041356,
 author = {Iwase, Shigeru and Kirkham, Christopher James and 小野, 倫也 and ONO, Tomoya},
 issue = {4},
 journal = {Physical review B},
 month = {Jan},
 title = {Intrinsic origin of electron scattering at the 4H-SiC(0001)/SiO2 interface},
 volume = {95},
 year = {2017},
 yomi = {オノ, トモヤ}
}