@misc{oai:tsukuba.repo.nii.ac.jp:00031470,
 author = {藤井, 泉},
 month = {},
 note = {2013, 【要旨】},
 title = {CMOS向け高誘電率ゲート絶縁膜の長期信頼性},
 year = {2014}
}