{"created":"2021-03-01T06:56:11.972222+00:00","id":18698,"links":{},"metadata":{"_buckets":{"deposit":"b74657fa-5932-4f16-a273-4f1507fc5ff6"},"_deposit":{"created_by":188,"id":"18698","owners":[188],"pid":{"revision_id":0,"type":"depid","value":"18698"},"status":"published"},"_oai":{"id":"oai:tsukuba.repo.nii.ac.jp:00018698","sets":["117:301","3:62:5612:1145"]},"author_link":["91"],"item_1_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010-02-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"74","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"WHAT's ON @ IBEC","bibliographic_titleLang":"en"}]}]},"item_1_publisher_27":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"産業技術総合研究所 ナノ電子デバイス研究センター","subitem_publisher_language":"ja"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"野村, 晋太郎","creatorNameLang":"ja"},{"creatorName":"ノムラ, シンタロウ","creatorNameLang":"ja-Kana"},{"creatorName":"NOMURA, Shintaro","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2013-12-20"}],"displaytype":"detail","filename":"What'sON@IBEC_通巻74.pdf","filesize":[{"value":"76.8 kB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tsukuba.repo.nii.ac.jp/record/18698/files/What'sON@IBEC_通巻74.pdf"},"version_id":"2a0b5b08-42ae-4ca7-a61e-b4a3536e80b9"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"半導体素子評価のための希釈冷凍機温度磁場中近接場光学顕微鏡の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"半導体素子評価のための希釈冷凍機温度磁場中近接場光学顕微鏡の開発","subitem_title_language":"ja"}]},"item_type_id":"1","owner":"188","path":["301","1145"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2010-02-23"},"publish_date":"2010-02-23","publish_status":"0","recid":"18698","relation_version_is_last":true,"title":["半導体素子評価のための希釈冷凍機温度磁場中近接場光学顕微鏡の開発"],"weko_creator_id":"188","weko_shared_id":-1},"updated":"2024-03-15T07:01:02.802972+00:00"}