{"created":"2021-03-01T06:53:44.071283+00:00","id":16676,"links":{},"metadata":{"_buckets":{"deposit":"4ba2563d-16e6-43ba-974b-d9db2a73ce6d"},"_deposit":{"created_by":188,"id":"16676","owners":[188],"pid":{"revision_id":0,"type":"depid","value":"16676"},"status":"published"},"_oai":{"id":"oai:tsukuba.repo.nii.ac.jp:00016676","sets":["117:135","117:801","3:62:5598:86"]},"author_link":["59119","205037","49"],"item_1644910766877":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_5_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"28","bibliographicPageStart":"286104","bibliographicVolumeNumber":"89","bibliographic_titles":[{"bibliographic_title":"Physical review letters","bibliographic_titleLang":"en"}]}]},"item_5_publisher_27":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Physical Society","subitem_publisher_language":"en"}]},"item_5_relation_10":{"attribute_name":"PubMed番号","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"12513167","subitem_relation_type_select":"PMID"}}]},"item_5_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1103/PhysRevLett.89.286104","subitem_relation_type_select":"DOI"}}]},"item_5_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"(c) 2002 The American Physical Society","subitem_rights_language":"en"}]},"item_5_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0031-9007","subitem_source_identifier_type":"PISSN"}]},"item_5_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00773679","subitem_source_identifier_type":"NCID"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hata, Kenji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"吉田, 昭二","creatorNameLang":"ja"},{"creatorName":"ヨシダ, ショウジ","creatorNameLang":"ja-Kana"},{"creatorName":"YOSHIDA, Shoji","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"重川, 秀実","creatorNameLang":"ja"},{"creatorName":"シゲカワ, ヒデミ","creatorNameLang":"ja-Kana"},{"creatorName":"SHIGEKAWA, Hidemi","creatorNameLang":"en"}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2013-12-19"}],"displaytype":"detail","filename":"PRL_89-28.pdf","filesize":[{"value":"575.1 kB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tsukuba.repo.nii.ac.jp/record/16676/files/PRL_89-28.pdf"},"version_id":"d5bb9e03-dfd9-46cb-9c55-1130f9ce3548"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"p(2×2) Phase of Buckled Dimers of Si(100) Observed on n-Type Substrates below 40 K by Scanning Tunneling Microscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"p(2×2) Phase of Buckled Dimers of Si(100) Observed on n-Type Substrates below 40 K by Scanning Tunneling Microscopy","subitem_title_language":"en"}]},"item_type_id":"5","owner":"188","path":["135","801","86"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2008-07-18"},"publish_date":"2008-07-18","publish_status":"0","recid":"16676","relation_version_is_last":true,"title":["p(2×2) Phase of Buckled Dimers of Si(100) Observed on n-Type Substrates below 40 K by Scanning Tunneling Microscopy"],"weko_creator_id":"188","weko_shared_id":-1},"updated":"2023-12-21T07:55:59.149107+00:00"}