2024-03-29T15:34:24Z
https://tsukuba.repo.nii.ac.jp/oai
oai:tsukuba.repo.nii.ac.jp:00040669
2023-12-21T06:13:06Z
117:133
3:62:5296:64
Fermi-level pinning of bilayer graphene with defects under an external electric field
Kishimoto, Ken
岡田, 晋
オカダ, ススム
OKADA, Susumu
journal article
AIP Publishing
2017-01
application/pdf
Applied Physics Letters
1
110
011601
0003-6951
AA00543431
https://tsukuba.repo.nii.ac.jp/record/40669/files/APL_110-1.pdf
eng
https://doi.org/10.1063/1.4973426
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.
The following article appeared in Appl. Phys. Lett. 110, 011601 (2017) and may be found at http://dx.doi.org/10.1063/1.4973426
open access