2024-03-28T13:52:13Z
https://tsukuba.repo.nii.ac.jp/oai
oai:tsukuba.repo.nii.ac.jp:00029399
2023-05-11T06:40:00Z
2777:2533
3:62:5591:1060
Test-Retest Reliability and Criterion-Related Validity of the Implicit Association Test for Measuring Shyness
FUJII, Tsutomu
SAWAUMI, Takafumi
相川, 充
アイカワ, アツシ
AIKAWA, Atsushi
journal article
電子情報通信学会
2013-08
application/pdf
IEICE Transactions on Information and Systems
8
E96.A
1768
1774
0916-8508
AA10826239
https://tsukuba.repo.nii.ac.jp/record/29399/files/IEICETF_E96A-8.pdf
eng
https://doi.org/10.1587/transfun.E96.A.1768
(c) 2013 The Institute of Electronics, Information and Communication Engineers
open access