2024-03-28T13:12:33Z
https://tsukuba.repo.nii.ac.jp/oai
oai:tsukuba.repo.nii.ac.jp:00019479
2023-06-12T01:47:29Z
3:267:274
Electrical, optical and structural characterization of extended defects in 4H-SiC films and multicrystalline Si
Chen, Bin
69922
陳, 斌
筑波大学
University of Tsukuba
博士(工学)
Doctor of Philosophy in Engineering
2009
【要旨】
thesis
2009
2009-07-24
application/pdf
甲第5169号
https://tsukuba.repo.nii.ac.jp/record/19479/files/A5169.pdf
jpn
open access