2024-03-29T10:42:30Z
https://tsukuba.repo.nii.ac.jp/oai
oai:tsukuba.repo.nii.ac.jp:00016607
2023-12-21T06:16:41Z
117:494
3:62:5296:64
Evaluation of minority-carrier diffusion length in n-type beta-FeSi2 single crystals by electron-beam-induced current
Ootsuka, Teruhisa
末益, 崇
スエマス, タカシ
SUEMASU, Takashi
Chen, Jun
Sekiguchi, Takashi
journal article
AIP Publishing
2008-01
application/pdf
Applied Physics Letters
4
92
42117
0003-6951
AA00543431
https://tsukuba.repo.nii.ac.jp/record/16607/files/APL-92_4.pdf
eng
https://doi.org/10.1063/1.2835904
© 2008 American Institute of Physics
open access