2024-03-29T07:01:44Z
https://tsukuba.repo.nii.ac.jp/oai
oai:tsukuba.repo.nii.ac.jp:00026983
2024-03-14T02:04:27Z
117:137
3:62:5592:1841
Impact of the Coulomb interaction on nano-scale silicon device characteristics
佐野, 伸行
サノ, ノブユキ
SANO, Nobuyuki
open access
© Springer Science+Business Media LLC 2010
The original publication is available at www.springerlink.com
Springer Science
2011-06
eng
journal article
AM
http://hdl.handle.net/2241/116755
https://tsukuba.repo.nii.ac.jp/records/26983
https://doi.org/10.1007/s10825-010-0327-6
1569-8025
AA1182882X
Journal of computational electronics
10
1-2
98
103
https://tsukuba.repo.nii.ac.jp/record/26983/files/JCE_10-1.pdf
application/pdf
387.8 kB
2013-12-25