2024-03-28T12:54:51Z
https://tsukuba.repo.nii.ac.jp/oai
oai:tsukuba.repo.nii.ac.jp:00016607
2023-12-21T06:16:41Z
117:494
3:62:5296:64
Evaluation of minority-carrier diffusion length in n-type beta-FeSi2 single crystals by electron-beam-induced current
Ootsuka, Teruhisa
末益, 崇
スエマス, タカシ
SUEMASU, Takashi
Chen, Jun
Sekiguchi, Takashi
open access
© 2008 American Institute of Physics
AIP Publishing
2008-01
eng
journal article
VoR
http://hdl.handle.net/2241/99947
https://tsukuba.repo.nii.ac.jp/records/16607
https://doi.org/10.1063/1.2835904
0003-6951
AA00543431
Applied Physics Letters
92
4
42117
https://tsukuba.repo.nii.ac.jp/record/16607/files/APL-92_4.pdf
application/pdf
201.6 kB
2013-12-19