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{"_buckets": {"deposit": "93c0ab7d-f572-4acf-9af7-892c6f710c63"}, "_deposit": {"id": "46573", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "46573"}, "status": "published"}, "_oai": {"id": "oai:tsukuba.repo.nii.ac.jp:00046573", "sets": ["1216", "6693"]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2017-10", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "10", "bibliographicPageEnd": "405", "bibliographicPageStart": "397", "bibliographicVolumeNumber": "60", "bibliographic_titles": [{"bibliographic_title": "Journal of the Vacuum Society of Japan (真空)"}]}]}, "item_5_creator_3": {"attribute_name": "著者別名", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "FUJITA, Jun-ichi"}], "nameIdentifiers": [{"nameIdentifier": "191387", "nameIdentifierScheme": "WEKO"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "High-sensitive visualization of the local electric and magnetic field is possible using a low energy electron beam combining with a simple grid detector configuration. The beam deflection goes along with the clear principle that the larger deflection can be induced by lower energy electron based on the Rutherford scattering scheme. The field distribution around two-dimensional materials allows quantitative analysis of the local field, showing good agreements with FEM simulation. Well defined beam scanning control established in the recent scanning electron microscope (SEM) can project the detector grid image superimposed on the specimen image. And thus the localized field distribution was easily visualized through a simple E-filed vector translation based on the deflection configuration. Detailed techniques and the analysis were described from the viewpoint of practical applications.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_27": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "公益社団法人日本表面真空学会"}]}, "item_5_publisher_28": {"attribute_name": "出版者別名", "attribute_value_mlt": [{"subitem_publisher": "The Vacuum Society of Japan"}]}, "item_5_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "10.3131/jvsj2.60.397", "subitem_relation_type_select": "DOI"}}]}, "item_5_relation_39": {"attribute_name": "異版である", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://www.jstage.jst.go.jp/article/jvsj2/60/10/60_17-RV-022/_article", "subitem_relation_type_select": "URI"}}]}, "item_5_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© 2017 The Vacuum Society of Japan"}]}, "item_5_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_5_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1882-2398", "subitem_source_identifier_type": "ISSN"}]}, "item_5_source_id_9": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AN00119871", "subitem_source_identifier_type": "NCID"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "藤田, 淳一"}, {"creatorName": "フジタ, ジュンイチ", "creatorNameLang": "ja-Kana"}], "nameIdentifiers": [{"nameIdentifier": "389", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "10361320", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000010361320"}, {"nameIdentifier": "0000000742", "nameIdentifierScheme": "筑波大学研究者総覧", "nameIdentifierURI": "http://trios.tsukuba.ac.jp/researcher/0000000742"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-06-04"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "JVSJ_60-10.pdf", "filesize": [{"value": "1.1 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1100000.0, "url": {"label": "JVSJ_60-10", "url": "https://tsukuba.repo.nii.ac.jp/record/46573/files/JVSJ_60-10.pdf"}, "version_id": "4b70aea3-81f5-44bd-8d60-e0639497ff0e"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "低加速電子線 SEM / STEM を用いた局在場可視化技術", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "低加速電子線 SEM / STEM を用いた局在場可視化技術"}, {"subitem_title": "Visualization of Localized Field Using Deflection of Low-Energy Electron Beam with SEM/STEM", "subitem_title_language": "en"}]}, "item_type_id": "5", "owner": "1", "path": ["1216", "6693"], "permalink_uri": "http://hdl.handle.net/2241/00151877", "pubdate": {"attribute_name": "公開日", "attribute_value": "2018-06-04"}, "publish_date": "2018-06-04", "publish_status": "0", "recid": "46573", "relation": {}, "relation_version_is_last": true, "title": ["低加速電子線 SEM / STEM を用いた局在場可視化技術"], "weko_shared_id": 5}
低加速電子線 SEM / STEM を用いた局在場可視化技術
http://hdl.handle.net/2241/00151877
http://hdl.handle.net/2241/00151877aff524b8-97be-4ffe-aca8-1fe7d2504f3d
名前 / ファイル | ライセンス | アクション |
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JVSJ_60-10 (1.1 MB)
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Item type | Journal Article(1) | |||||
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公開日 | 2018-06-04 | |||||
タイトル | ||||||
タイトル | 低加速電子線 SEM / STEM を用いた局在場可視化技術 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Visualization of Localized Field Using Deflection of Low-Energy Electron Beam with SEM/STEM | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
著者 |
藤田, 淳一
× 藤田, 淳一 |
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著者別名 |
FUJITA, Jun-ichi
× FUJITA, Jun-ichi |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | High-sensitive visualization of the local electric and magnetic field is possible using a low energy electron beam combining with a simple grid detector configuration. The beam deflection goes along with the clear principle that the larger deflection can be induced by lower energy electron based on the Rutherford scattering scheme. The field distribution around two-dimensional materials allows quantitative analysis of the local field, showing good agreements with FEM simulation. Well defined beam scanning control established in the recent scanning electron microscope (SEM) can project the detector grid image superimposed on the specimen image. And thus the localized field distribution was easily visualized through a simple E-filed vector translation based on the deflection configuration. Detailed techniques and the analysis were described from the viewpoint of practical applications. | |||||
書誌情報 |
Journal of the Vacuum Society of Japan (真空) 巻 60, 号 10, p. 397-405, 発行日 2017-10 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1882-2398 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00119871 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.3131/jvsj2.60.397 | |||||
権利 | ||||||
権利情報 | © 2017 The Vacuum Society of Japan | |||||
著者版フラグ | ||||||
値 | author | |||||
出版者 | ||||||
出版者 | 公益社団法人日本表面真空学会 | |||||
出版者別名 | ||||||
出版者 | The Vacuum Society of Japan | |||||
関連情報 | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | URI | |||||
関連識別子 | https://www.jstage.jst.go.jp/article/jvsj2/60/10/60_17-RV-022/_article |