WEKO3
アイテム
{"_buckets": {"deposit": "d023375d-f04f-41a2-aa1f-55529de6e513"}, "_deposit": {"id": "28171", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "28171"}, "status": "published"}, "_oai": {"id": "oai:tsukuba.repo.nii.ac.jp:00028171", "sets": ["1206"]}, "item_5_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2013-01", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "111", "bibliographicPageStart": "107", "bibliographicVolumeNumber": "699", "bibliographic_titles": [{"bibliographic_title": "Nuclear instruments \u0026 methods in physics research. Section A"}]}]}, "item_5_creator_3": {"attribute_name": "著者別名", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "原, 和彦"}], "nameIdentifiers": [{"nameIdentifier": "157115", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "20218613", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000020218613"}, {"nameIdentifier": "0000000587", "nameIdentifierScheme": "筑波大学研究者総覧", "nameIdentifierURI": "http://trios.tsukuba.ac.jp/researcher/0000000587"}]}, {"creatorNames": [{"creatorName": "金, 信弘"}], "nameIdentifiers": [{"nameIdentifier": "365", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "50161609", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000050161609"}, {"nameIdentifier": "0000000610", "nameIdentifierScheme": "筑波大学研究者総覧", "nameIdentifierURI": "http://trios.tsukuba.ac.jp/researcher/0000000610"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "We are developing p-bulk microstrip sensors for the high luminosity upgrade of the LHC accelerator, HL-LHC. The stability of FZ (float zone) wafers available to Hamamatsu Photonics was examined by irradiating them at rates expected at the HL-LHC. They show degradation in the operational voltage at low dose but recover after the dose is accumulated. The instability is dependent on the bias voltage and dose rate, and also on the irradiation history. We have characterized the instability and attributed the cause to the charge concentration at the electrode edge. The strip isolation, which is degraded while in irradiation, is shown not to induce any practical problem for the operation.", "subitem_description_type": "Abstract"}]}, "item_5_identifier_34": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2241/118286"}]}, "item_5_publisher_27": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Elsevier B.V."}]}, "item_5_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1016/j.nima.2012.04.031", "subitem_relation_type_select": "DOI"}}]}, "item_5_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© 2012 ElsevierB.V.\nNOTICE: this is the author’s version of a work that was accepted for publication in Nuclear instruments \u0026 methods in physics research. Section A. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in PUBLICATION, 699 (2013) DOI:10.1016/j.nima.2012.04.031"}]}, "item_5_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_5_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0168-9002", "subitem_source_identifier_type": "ISSN"}]}, "item_5_source_id_9": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10529991", "subitem_source_identifier_type": "NCID"}]}, "item_5_subject_20": {"attribute_name": "NIIサブジェクト", "attribute_value_mlt": [{"subitem_subject": "物理学", "subitem_subject_scheme": "Other"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Takahashi, Y."}], "nameIdentifiers": [{"nameIdentifier": "97503", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Hara, K."}], "nameIdentifiers": [{"nameIdentifier": "97504", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kim, S."}], "nameIdentifiers": [{"nameIdentifier": "97505", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Ikegami, Y."}], "nameIdentifiers": [{"nameIdentifier": "97506", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Takubo, Y."}], "nameIdentifiers": [{"nameIdentifier": "97507", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Terada, S."}], "nameIdentifiers": [{"nameIdentifier": "97508", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Unno, Y."}], "nameIdentifiers": [{"nameIdentifier": "97509", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Mitsui, S."}], "nameIdentifiers": [{"nameIdentifier": "97510", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kamada, S."}], "nameIdentifiers": [{"nameIdentifier": "97511", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamamura, K."}], "nameIdentifiers": [{"nameIdentifier": "97512", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2013-12-25"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "NIMPRSA_699_107.pdf", "filesize": [{"value": "1.4 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1400000.0, "url": {"label": "NIMPRSA_699_107.pdf", "url": "https://tsukuba.repo.nii.ac.jp/record/28171/files/NIMPRSA_699_107.pdf"}, "version_id": "ee5e1e58-236d-4624-902c-f88fe4660015"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Performance of p-bulk microstrip sensors under 60Co γ irradiation at rates expected at the HL-LHC", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Performance of p-bulk microstrip sensors under 60Co γ irradiation at rates expected at the HL-LHC"}]}, "item_type_id": "5", "owner": "1", "path": ["1206", "789", "1364"], "permalink_uri": "http://hdl.handle.net/2241/118286", "pubdate": {"attribute_name": "公開日", "attribute_value": "2013-02-08"}, "publish_date": "2013-02-08", "publish_status": "0", "recid": "28171", "relation": {}, "relation_version_is_last": true, "title": ["Performance of p-bulk microstrip sensors under 60Co γ irradiation at rates expected at the HL-LHC"], "weko_shared_id": 5}
Performance of p-bulk microstrip sensors under 60Co γ irradiation at rates expected at the HL-LHC
http://hdl.handle.net/2241/118286
http://hdl.handle.net/2241/11828680f21c79-66df-4508-955b-013b6014976d
名前 / ファイル | ライセンス | アクション |
---|---|---|
NIMPRSA_699_107.pdf (1.4 MB)
|
|
Item type | Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2013-02-08 | |||||
タイトル | ||||||
タイトル | Performance of p-bulk microstrip sensors under 60Co γ irradiation at rates expected at the HL-LHC | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
著者 |
Takahashi, Y.
× Takahashi, Y.× Hara, K.× Kim, S.× Ikegami, Y.× Takubo, Y.× Terada, S.× Unno, Y.× Mitsui, S.× Kamada, S.× Yamamura, K. |
|||||
著者別名 |
原, 和彦
× 原, 和彦× 金, 信弘 |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We are developing p-bulk microstrip sensors for the high luminosity upgrade of the LHC accelerator, HL-LHC. The stability of FZ (float zone) wafers available to Hamamatsu Photonics was examined by irradiating them at rates expected at the HL-LHC. They show degradation in the operational voltage at low dose but recover after the dose is accumulated. The instability is dependent on the bias voltage and dose rate, and also on the irradiation history. We have characterized the instability and attributed the cause to the charge concentration at the electrode edge. The strip isolation, which is degraded while in irradiation, is shown not to induce any practical problem for the operation. | |||||
書誌情報 |
Nuclear instruments & methods in physics research. Section A 巻 699, p. 107-111, 発行日 2013-01 |
|||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0168-9002 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA10529991 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1016/j.nima.2012.04.031 | |||||
権利 | ||||||
権利情報 | © 2012 ElsevierB.V. NOTICE: this is the author’s version of a work that was accepted for publication in Nuclear instruments & methods in physics research. Section A. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in PUBLICATION, 699 (2013) DOI:10.1016/j.nima.2012.04.031 |
|||||
著者版フラグ | ||||||
値 | author | |||||
出版者 | ||||||
出版者 | Elsevier B.V. | |||||
URI | ||||||
識別子 | http://hdl.handle.net/2241/118286 | |||||
識別子タイプ | HDL |