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Direct Observation of Radical States and the Correlation with Performance Degradation in Organic Light-Emitting Diodes During Device Operation
http://hdl.handle.net/2241/00152993
http://hdl.handle.net/2241/00152993e63fe272-617a-4323-ba7d-404bac8e9c43
名前 / ファイル | ライセンス | アクション |
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PSSA_215-7 (995.0 kB)
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Item type | Journal Article(1) | |||||
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公開日 | 2018-07-27 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Direct Observation of Radical States and the Correlation with Performance Degradation in Organic Light-Emitting Diodes During Device Operation | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
著者 |
Sato, Go
× Sato, Go× Son, Donghyun× Ito, Taisuke× Osawa, Fumiya× Cho, Yujin× Marumoto, Kazuhiro |
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著者別名 |
丸本, 一弘
× 丸本, 一弘 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Microscopic characterization of radical states in organic light‐emitting diodes (OLEDs) during device operation is useful for elucidating the degradation mechanism because the radical formation has been considered as non‐radiative recombination centers. Electron spin resonance (ESR) spectroscopy is suitable for such characterization because it can directly observe radicals in OLEDs. In this work, the detailed ESR investigation into the radical states in OLEDs during device operation is firstly reported using a typical light‐emitting Alq3‐based OLEDs. The simultaneous measurements of the ESR signal and the luminance of the same OLED are performed to study the direct correlation between the radical states and the performance degradation. These characteristics show that the luminance monotonically decreases and an ESR signal concomitantly increases as the duration of the device operation increases after operating the OLED. Using the analysis of density functional theory (DFT) calculation, the origin of the newly emerged ESR signal is ascribed to the cationic species due to decomposed Alq3 molecules. The elucidation of the radical species formed in OLEDs during device operation has been demonstrated at a molecular level for the first time. This ESR analysis would provide useful knowledge for understanding the degradation mechanism in the OLEDs at the molecular level. | |||||
書誌情報 |
en : physica status solidi (a) 巻 215, 号 7, p. 1700731, 発行日 2018-01 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1862-6300 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1002/pssa.201700731 | |||||
権利 | ||||||
言語 | en | |||||
権利情報 | © 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim | |||||
著者版フラグ | ||||||
値 | author | |||||
出版者 | ||||||
言語 | en | |||||
出版者 | wiley |